Деталі електронної книги

Test-Driven Machine Learning. Control your machine learning algorithms using test-driven development to achieve quantifiable milestones

Test-Driven Machine Learning. Control your machine learning algorithms using test-driven development to achieve quantifiable milestones

Joshua Burkhow, Justin Bozonier, Stefano Paluello

Eлектронна книга
  • 1. Introduction to Test Driving Machine Learning
  • 2. Neurotically test a neural network
  • 3. Exploring the unknown with multi-armed bandits
  • 4. Predicting values with regression
  • 5. Making decisions black and white with logistic regression
  • 6. Naïvely labeling with Naïve Bayes Classification
  • 7. Optimizing by choosing a new algorithm (Random Forest)
  • 8. Exploring SciKit-Learn test first
  • 9. Bringing it all together
  • Назва: Test-Driven Machine Learning. Control your machine learning algorithms using test-driven development to achieve quantifiable milestones
  • Автор: Joshua Burkhow, Justin Bozonier, Stefano Paluello
  • Оригінальна назва: Test-Driven Machine Learning. Control your machine learning algorithms using test-driven development to achieve quantifiable milestones
  • ISBN: 9781784396367, 9781784396367
  • Дата видання: 2015-11-27
  • Формат: Eлектронна книга
  • Ідентифікатор видання: e_3csg
  • Видавець: Packt Publishing